Photodiode with incident flux input port
Simscape / Electrical / Sensors & Transducers

The Photodiode block represents a photodiode as a controlled current source and an exponential diode connected in parallel. The controlled current source produces a current Ip that is proportional to the radiant flux density:
| Ip = DeviceSensitivity · RadiantFluxDensity | (1) |
where:
DeviceSensitivity is the ratio of the current produced to the incident radiant flux density.
If you select Specify measured current for given flux
density for the Sensitivity parameterization parameter,
the block calculates this variable by converting the Measured current
parameter value to units of amps and dividing it by the Flux density
parameter values.
If you select Specify current per unit flux density for the
Sensitivity parameterization parameter, this variable is defined by
the Device sensitivity parameter value.
RadiantFluxDensity is the incident radiant flux density.
To model dynamic response time, use the Parameterization parameter in the Junction capacitance tab to include the diode junction capacitance in the model.
The exponential diode model provides the following relationship between the diode current I and the diode voltage V:
where:
q is the elementary charge on an electron (1.602176e–19 Coulombs).
k is the Boltzmann constant (1.3806503e–23 J/K).
N is the emission coefficient.
IS is the saturation current, which is equal to the Dark current parameter value.
Tm1 is the temperature at which the diode parameters are specified, as defined by the Measurement temperature parameter value.
When (qV / NkTm1) > 80, the block replaces with (qV / NkTm1 – 79)e80, which matches the gradient of the diode current at (qV / NkTm1) = 80 and extrapolates linearly. When (qV / NkTm1) < –79, the block replaces with (qV / NkTm1 + 80)e–79, which also matches the gradient and extrapolates linearly. Typical electrical circuits do not reach these extreme values. The block provides this linear extrapolation to help convergence when solving for the constraints during simulation.
When you select Use dark current and N for the Diode
parameterization parameter, you specify the diode in terms of the Dark
current and Emission coefficient N parameters. When you select
Use dark current plus a forward bias I-V data point for the
Diode parameterization parameter, you specify the Dark
current parameter and a voltage and current measurement point on the diode I-V curve.
The block calculates N from these values as follows:
where:
VF is the Forward voltage VF parameter value.
Vt = kTm1 / q.
IF is the Current IF at forward voltage VF parameter value.
The exponential diode model provides the option to include a junction capacitance:
When you select Fixed or zero junction capacitance for
the Parameterization parameter, the capacitance is fixed.
When you select Use parameters CJO, VJ, M & FC for
the Parameterization parameter, the block uses the coefficients
CJO, VJ, M, and
FC to calculate a junction capacitance that depends on the junction
voltage.
When you select Use C-V curve data points for the
Parameterization parameter, the block uses three capacitance
values on the C-V capacitance curve to estimate CJO,
VJ, and M and uses these values with the
specified value of FC to calculate a junction capacitance that
depends on the junction voltage. The block calculates CJO,
VJ, and M as follows:
where:
VR1, VR2, and VR3 are the values in the Reverse bias voltages [VR1 VR2 VR3] vector.
C1, C2, and C3 are the values in the Corresponding capacitances [C1 C2 C3] vector.
It is not possible to estimate FC reliably from tabulated data, so you must specify its value using the Capacitance coefficient FC parameter. In the absence of suitable data for this parameter, use a typical value of 0.5.
The reverse bias voltages (defined as positive values) should satisfy VR3 > VR2 > VR1. This means that the capacitances should satisfy C1 > C2 > C3 as reverse bias widens the depletion region and hence reduces capacitance. Violating these inequalities results in an error. Voltages VR2 and VR3 should be well away from the Junction potential VJ. Voltage VR1 should be less than the Junction potential VJ, with a typical value for VR1 being 0.1 V.
The voltage-dependent junction is defined in terms of the capacitor charge storage Qj as:
For V < FC·VJ:
For V ≥ FC·VJ:
where:
These equations are the same as used in [2], except that the temperature dependence of VJ and FC is not modeled. This model does not include the diffusion capacitance term that affects performance for high frequency switching applications.
The Photodiode block contains several options for modeling the dependence of the diode current-voltage relationship on the temperature during simulation. Temperature dependence of the junction capacitance is not modeled, this being a much smaller effect. For details, see the Diode reference page.
The block has an optional thermal port, hidden by default. To expose the thermal port, right-click the block in your model, and then from the context menu select Simscape > Block choices > Show thermal port. This action displays the thermal port H on the block icon, and exposes the Thermal Port parameters.
Use the thermal port to simulate the effects of generated heat and device temperature. For more information on using thermal ports and on the Thermal Port parameters, see Simulating Thermal Effects in Semiconductors.
Use the Variables section of the block interface to set the priority and initial target values for the block variables prior to simulation. For more information, see Set Priority and Initial Target for Block Variables.
When you select Use dark current plus a forward bias I-V curve data
point for the Diode parameterization parameter, choose a
voltage near the diode turn-on voltage. Typically this will be in the range from 0.05 to 1
Volt. Using a value outside of this region may lead to a poor estimate for
N.
You may need to use nonzero ohmic resistance and junction capacitance values to prevent numerical simulation issues, but the simulation may run faster with these values set to zero.
[1] H. Ahmed and P.J. Spreadbury. Analogue and digital electronics for engineers. 2nd Edition, Cambridge University Press, 1984.
[2] G. Massobrio and P. Antognetti. Semiconductor Device Modeling with SPICE. 2nd Edition, McGraw-Hill, 1993.